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Analysis of current collapse effect in AlGaN/GaN HEMT: Experiments and numerical simulations

✍ Scribed by M. Faqir; M. Bouya; N. Malbert; N. Labat; D. Carisetti; B. Lambert; G. Verzellesi; F. Fantini

Book ID: 108210879
Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 370 KB
Volume: 50
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2010.07.020

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