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Analysis of a thin AlN interfacial layer in Ti/Al and Pd/Al ohmic contacts to n-type GaN

✍ Scribed by Luther, B. P.; DeLucca, J. M.; Mohney, S. E.; Karlicek, R. F.


Book ID
120042907
Publisher
American Institute of Physics
Year
1997
Tongue
English
Weight
464 KB
Volume
71
Category
Article
ISSN
0003-6951

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