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Combinatorial optimization of Ti/Al/Ti/Au ohmic contacts to n-GaN

✍ Scribed by A.V. Davydov; A. Motayed; W.J. Boettinger; R.S. Gates; Q. Z. Xue; H. C. Lee; Y. K. Yoo


Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
734 KB
Volume
2
Category
Article
ISSN
1862-6351

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Electrical and microstructural propertie
✍ Rajagopal Reddy, V. ;Choi, Chel-Jong πŸ“‚ Article πŸ“… 2007 πŸ› John Wiley and Sons 🌐 English βš– 473 KB

## Abstract The microstructural and electrical properties of Ti/Re/Au (10 nm/10 nm/50 nm) ohmic contacts to moderately doped n‐type GaN (4.0 Γ— 10^18^ cm^–3^) have been investigated by current–voltage (__I__ –__V__), Auger electron microscopy (AES) and transmission electron microscopy (TEM). The ele