Measurements of X-ray fluorescence spectra versus grazing incident angles provide information on elemental composition as well as density and thickness of near surface layers. Calculations of fluorescence intensities are presented, which are used for the evaluation of data obtained by total reflecti
β¦ LIBER β¦
Analogies between quantitative X-ray fluorescence analysis (XRFA) and quantitative X-ray photoelectron spectrometry (XPS)
β Scribed by H. Ebel; Maria F. Ebel
- Book ID
- 118286580
- Publisher
- John Wiley and Sons
- Year
- 1973
- Tongue
- English
- Weight
- 573 KB
- Volume
- 2
- Category
- Article
- ISSN
- 0049-8246
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