𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Analogies between quantitative X-ray fluorescence analysis (XRFA) and quantitative X-ray photoelectron spectrometry (XPS)

✍ Scribed by H. Ebel; Maria F. Ebel


Book ID
118286580
Publisher
John Wiley and Sons
Year
1973
Tongue
English
Weight
573 KB
Volume
2
Category
Article
ISSN
0049-8246

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Total reflection X-ray fluorescence spec
✍ U. Weisbrod; R. Gutschke; J. Knoth; H. Schwenke πŸ“‚ Article πŸ“… 1991 πŸ› Springer 🌐 English βš– 622 KB

Measurements of X-ray fluorescence spectra versus grazing incident angles provide information on elemental composition as well as density and thickness of near surface layers. Calculations of fluorescence intensities are presented, which are used for the evaluation of data obtained by total reflecti

Error factors in quantitative total refl
✍ Yoshihiro Mori; Kenichi Uemura πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 116 KB πŸ‘ 1 views

This paper reviews and discusses the error factors in quantitative total reflection x-ray fluorescence analysis, primarily with regard to the surface contamination of silicon wafers. The error factors were classified into three origins: instrumental, sample and data processing. The instrumental erro