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X-ray induced fluorescence spectrometry at grazing incidence for quantitative surface and layer analysis

✍ Scribed by U. Weisbrod; R. Gutschke; J. Knoth; H. Schwenke

Book ID
112291123
Publisher
Springer
Year
1991
Tongue
English
Weight
295 KB
Volume
341
Category
Article
ISSN
1618-2650

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Total reflection X-ray fluorescence spec
Total reflection X-ray fluorescence spectrometry for quantitative surface and layer analysis
✍ U. Weisbrod; R. Gutschke; J. Knoth; H. Schwenke πŸ“‚ Article πŸ“… 1991 πŸ› Springer 🌐 English βš– 622 KB

Measurements of X-ray fluorescence spectra versus grazing incident angles provide information on elemental composition as well as density and thickness of near surface layers. Calculations of fluorescence intensities are presented, which are used for the evaluation of data obtained by total reflecti