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Grazing incidence X-ray diffraction from Si with an implantation induced amorphous surface layer

✍ Scribed by Wallner, G. ;Burkel, E. ;Metzger, H. ;Peisl, J.


Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
294 KB
Volume
108
Category
Article
ISSN
0031-8965

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