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An investigation of point defects in silicon carbide

✍ Scribed by Puff, W.; Boumerzoug, M.; Brown, J.; Mascher, P.; Macdonald, D.; Simpson, P. J.; Balogh, A. G.; Hahn, H.; Chang, W.; Rose, M.

Book ID: 111949718
Publisher: Springer
Year: 1995
Tongue: English
Weight: 434 KB
Volume: 61
Category: Article
ISSN: 1432-0630
DOI: 10.1007/bf01538211

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