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Intrinsic Defects in Cubic Silicon Carbide

✍ Scribed by Itoh, H. ;Kawasuso, A. ;Ohshima, T. ;Yoshikawa, M. ;Nashiyama, I. ;Tanigawa, S. ;Misawa, S. ;Okumura, H. ;Yoshida, S.

Publisher
John Wiley and Sons
Year
1997
Tongue
English
Weight
431 KB
Volume
162
Category
Article
ISSN
0031-8965

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