A complete empirical large-signal model for the GaAs-and GaN-based HEMTs is presented. Three generalized drain current I-V models characterized by the multi-bias Pulsed I-V measurements are presented along with their dependence on temperature and quiescent bias state. The new I-V equations dedicated
An empirical HBT large-signal model for CAD
✍ Scribed by I. Angelov; K. Choumei; A. Inoue
- Publisher
- John Wiley and Sons
- Year
- 2003
- Tongue
- English
- Weight
- 426 KB
- Volume
- 13
- Category
- Article
- ISSN
- 1096-4290
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✦ Synopsis
A new, simple heterojunction bipolar transistor (HBT) large-signal model for use in CAD is proposed and experimentally evaluated. The important development in this model is that the main model parameters are derived directly from the measurements taken during typical operating conditions. The model was evaluated with extensive measurements at different temperatures by DC, S, and power-spectrum measurements. Good correspondence was obtained between the measurement and experimental results.
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