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An ellipsometric study of the growth and open-circuit dissolution of the anodic oxide film on titanium

✍ Scribed by D.J. Blackwood; R. Greef; L.M. Peter

Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 460 KB
Volume: 34
Category: Article
ISSN: 0013-4686
DOI: 10.1016/0013-4686(89)87123-3

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✦ Synopsis

Abstrae

-The behaviour of titanium in 3.0 moldm-" H,SO, has been studied by in situ ellipsomtiry. The growth and subsequent dissolution of the anodic oxide under opcn-eireuit conditions have been characterised and in addition evidence for the formation of a suboxide layer hetween the metal and the dioxide tilm has been obtained. The elliesometric data show that thinnina of the oxide 6hn in H,SO, at ooen-circuit occurs by uniform dissolutibn at a constant rate, rather than by loealixecl attack. The& r&&s c&irm the conclusions reached in a previous study in which the charge required to regrow the film following partial dissolution was measured by linear sweep voltammetry.

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