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An effective two-pattern test generator for Arithmetic BIST

✍ Scribed by Voyiatzis, I.; Efstathiou, C.; Antonopoulou, H.; Milidonis, A.

Book ID: 121915624
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 429 KB
Volume: 39
Category: Article
ISSN: 0045-7906
DOI: 10.1016/j.compeleceng.2012.10.006

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