✦ LIBER ✦

A Ring Architecture Strategy for BIST Test Pattern Generation

✍ Scribed by C. Fagot; O. Gascuel; P. Girard; C. Landrault

Book ID: 110440520
Publisher: Springer US
Year: 2003
Tongue: English
Weight: 95 KB
Volume: 19
Category: Article
ISSN: 0923-8174
DOI: 10.1023/a:1023788727542

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

BIST-oriented test pattern generator for

BIST-oriented test pattern generator for detection of transition faults

✍ Takeshi Asakawa; Kazuhiko Iwasaki; Seiji Kajihara 📂 Article 📅 2003 🏛 John Wiley and Sons 🌐 English ⚖ 999 KB

## Abstract As a technique for complementing the long testing time, which is a shortcoming of pseudo‐random pattern test, we will propose a BIST‐oriented test pattern generator (TPG) which achieves high fault detection efficiency with a short testing time for transition faults. The proposed TPG is

An Efficient Deterministic Test Pattern

An Efficient Deterministic Test Pattern Generator for Scan-Based BIST Environment

✍ Wei-Lun Wang; Kuen-Jong Lee 📂 Article 📅 2002 🏛 Springer US 🌐 English ⚖ 187 KB

A parallel system for test pattern gener

A parallel system for test pattern generation

✍ G.P Balboni; G.P Cabodi; S Gai; M Sonza Reorda 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 544 KB

A Low-Cost BIST Architecture for Linear

A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs

✍ F. Azaïs; S. Bernard; Y. Bertrand; M. Renovell 📂 Article 📅 2001 🏛 Springer US 🌐 English ⚖ 379 KB

Provably good pattern generators for a r

Provably good pattern generators for a random pattern test

✍ Thomas H. Spencer 📂 Article 📅 1994 🏛 Springer 🌐 English ⚖ 652 KB

A Discussion on Test Pattern Generation

A Discussion on Test Pattern Generation for FPGA—Implemented Circuits

✍ M. Renovell; J.M. Portal; P. Faure; J. Figueras; Y. Zorian 📂 Article 📅 2001 🏛 Springer US 🌐 English ⚖ 248 KB