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Provably good pattern generators for a random pattern test

โœ Scribed by Thomas H. Spencer

Publisher
Springer
Year
1994
Tongue
English
Weight
652 KB
Volume
11
Category
Article
ISSN
0178-4617

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โœ Ueli M. Maurer ๐Ÿ“‚ Article ๐Ÿ“… 1992 ๐Ÿ› Springer ๐ŸŒ English โš– 884 KB

A new statistical test for random bit generators is presented which, in contrast to presently used statistical tests, is universal in the sense that it can detect any significant deviation of a device's output statistics from the statistics of a truly random bit source when the device can be modeled