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An Accumulator-Based BIST Approach for Two-Pattern Testing

โœ Scribed by I. Voyiatzis; A. Paschalis; D. Nikolos; C. Halatsis


Book ID
110262443
Publisher
Springer US
Year
1999
Tongue
English
Weight
99 KB
Volume
15
Category
Article
ISSN
0923-8174

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