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Design of efficient BIST test pattern generators for delay testing

✍ Scribed by Chih-Ang Chen; Gupta, S.K.

Book ID: 119778098
Publisher: IEEE
Year: 1996
Tongue: English
Weight: 247 KB
Volume: 15
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.552090

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