✦ LIBER ✦

An effective test generation algorithm for combinational circuits

✍ Scribed by Jianchao Wang; Daozheng Wei

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A complete critical path algorithm for t

✍ Quan Zhou; Daozheng Wei 📂 Article 📅 1991 🏛 Springer 🌐 English ⚖ 490 KB

Pseudo-random test generation for large

✍ Zhongcheng Li; Yinghua Min 📂 Article 📅 1992 🏛 Springer 🌐 English ⚖ 560 KB

Test generation for combinational logic

✍ P.D. Stigall; Y.M. Erten 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 582 KB

Stuck-open faults test generation for cm

✍ Seiji Kajihara; Noriyoshi Itazaki; Kozo Kinoshita 📂 Article 📅 1991 🏛 John Wiley and Sons 🌐 English ⚖ 716 KB

Combinational automatic test pattern gen

✍ Yong Chang Kim; Agrawal, V.D.; Saluja, K.K. 📂 Article 📅 2005 🏛 IEEE 🌐 English ⚖ 493 KB

An Algorithm for the Generation of Test

✍ Wang, D.T. 📂 Article 📅 1975 🏛 IEEE 🌐 English ⚖ 976 KB