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A complete critical path algorithm for test generation of combinational circuits

✍ Scribed by Quan Zhou; Daozheng Wei


Book ID
112947406
Publisher
Springer
Year
1991
Tongue
English
Weight
490 KB
Volume
6
Category
Article
ISSN
1000-9000

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πŸ“œ SIMILAR VOLUMES


An algorithm to generate complete test s
✍ Leonard J. Tung; David V. Kerns πŸ“‚ Article πŸ“… 1988 πŸ› Elsevier Science 🌐 English βš– 581 KB

A new algorithm to generate test sets for stuck-at faults in combinational logic circuits via fault simulation is presented. The algorithm is non-path-sensitizing, non-pathtracing and can be easily implemented on a computer. The stuck-at fault model in the algorithm is developed using the component