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An automated system for measurement of random telegraph noise in metal-oxide-semiconductor field-effect transistors

✍ Scribed by Hung, K.K.; Ko, P.K.; Hu, C.; Cheng, Y.C.


Book ID
114535398
Publisher
IEEE
Year
1989
Tongue
English
Weight
266 KB
Volume
36
Category
Article
ISSN
0018-9383

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