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A study of lattice damage in silicon induced by BF+2 ion implantation

✍ Scribed by Paek, Mun Cheol; Kwon, Oh Joon; Lee, Jeong Yong; Im, Ho Bin


Book ID
126864912
Publisher
American Institute of Physics
Year
1991
Tongue
English
Weight
989 KB
Volume
70
Category
Article
ISSN
0021-8979

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