𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Dynamic simulation of damage accumulation during implantation of BF2+ molecular ions into crystalline silicon

✍ Scribed by M. Posselt


Book ID
113287655
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
467 KB
Volume
102
Category
Article
ISSN
0168-583X

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES