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A simple method for the measurement of stress in evaporated thin films by real-time holographic interferometry

✍ Scribed by B.S. Ramprasad; T.S. Radha

Book ID: 107862529
Publisher: Elsevier Science
Year: 1978
Tongue: English
Weight: 480 KB
Volume: 51
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(78)90296-1

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