✦ LIBER ✦
964. A method for measurement of thickness of thin dielectric films during the process of their evaporation in vacuum: V I Matveev and Yu V Salnikov, Rep of Moscow Bauman High Tech School, No 155, 1973, 103–106 (in Russian)
- Publisher
- Elsevier Science
- Year
- 1974
- Tongue
- English
- Weight
- 145 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0042-207X
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