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Interference method for determing the formation time of thin dielectric ans semiconductor films and the measurment of their thicknees: E n Mal'kov and A V Rakov, Optika i Spektros, 18, 1965, 717–719, (in Russian)


Book ID
107867324
Publisher
Elsevier Science
Year
1966
Tongue
English
Weight
117 KB
Volume
16
Category
Article
ISSN
0042-207X

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