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A re-examination of cobalt-related defects in n- and p-type silicon

✍ Scribed by Scheffler, Leopold ;Kolkovsky, Vladimir ;Weber, Jörg

Book ID: 112181028
Publisher: John Wiley and Sons
Year: 2012
Tongue: English
Weight: 497 KB
Volume: 209
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.201200140

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