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A qualitative and quantitative study of the oxides of aluminum and silicon using AES and XPS

✍ Scribed by J.A. Kovacich; D. Lichtman

Publisher: Elsevier Science
Year: 1985
Tongue: English
Weight: 828 KB
Volume: 35
Category: Article
ISSN: 0368-2048
DOI: 10.1016/0368-2048(85)80038-4

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