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XPS and AES study of reactive TiSi interface

✍ Scribed by E. Buzaneva; T. Vdovenkova; S. Litvinenko; V. Makhnjuk; V. Strikha; V. Skryshevsky; P. Shevchuk; V. Nemoshkalenko; A. Senkevich; A. Shpak

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 385 KB
Volume: 68
Category: Article
ISSN: 0368-2048
DOI: 10.1016/0368-2048(94)02178-3

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