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XPS and AES Studies of the Cr/Al2O3 Interface

✍ Scribed by Lu, Hua ;Shen, D. H. ;Bao, C. L. ;Wang, Y. X.

Publisher: John Wiley and Sons
Year: 1997
Tongue: English
Weight: 308 KB
Volume: 159
Category: Article
ISSN: 0031-8965
DOI: 10.1002/1521-396x(199702)159:2<425::aid-pssa425>3.0.co;2-w

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