XPS Measurement for the Elements in the Interface between Oxygen Ion Irradiated ZrO2–Y2O3 Films and Iron Substrate

✍ Scribed by Zhang, H. L. ;Wang, D. Z. ;Yang, B. ;Huang, N. K.

• Publisher: John Wiley and Sons
• Year: 1997
• Tongue: English
• Weight: 195 KB
• Volume: 160
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/1521-396x(199703)160:1<145::aid-pssa145>3.0.co;2-5