AES and XPS studies of Cl− ion penetration and the chemical composition of oxide films on aluminium
✍ Scribed by Lj.D. Atanasoska; A. Zalar
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 107 KB
- Volume
- 37
- Category
- Article
- ISSN
- 0042-207X
No coin nor oath required. For personal study only.
📜 SIMILAR VOLUMES
The chemical composition and microstructure of dual ion beam-deposited Ðlms with nitrogen contents in the CN x range 20-33 at.% have been examined by Fourier transform infrared spectroscopy (FTIR) and x-ray photoelectron spectroscopy (XPS). The FTIR spectra together with other published data have be
The kinetics of passivation of Fe in pH 8.4 borate buffer solution at 0.0 V have been studied in both the presence and absence of 0.5 M Cl-. Cl-has no influence on the decay of the passive current with time over the course of several hours. Oxide films were examined by AES and SIMS for possible Clin
The purpose of this work was to study surface diffusion of atoms in Au-Ag films deposited on SiO 2 substrate under the action of a d.c. field, focusing on the effect of chemical reaction at the Au-Ag/SiO 2 interface on the electromigration behaviour. Atomic force microscopy measurement depicted the