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A novel trench gate MOSFET with a multiple-layered gate oxide for high-reliability operation

✍ Scribed by Sang Gi Kim, Dong Ha Kah, Kyoung Il Na, Yil Suk Yang, Jin Gun Koo, Jong Dae Kim, Jin Ho Lee, Hoon Soo Park

Book ID: 115076866
Publisher: The Korean Physical Society
Year: 2012
Tongue: English
Weight: 555 KB
Volume: 60
Category: Article
ISSN: 0374-4884
DOI: 10.3938/jkps.60.1552

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