✦ LIBER ✦
Improved performance and reliability of MOSFETs with thin gate oxides grown at high temperature : A. B. Joshi, G. Q. Lo, D. L. Kwong, and S. Lee. IEEE/IRPS, 316 (1991)
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 100 KB
- Volume
- 32
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.