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A double-layer current conduction model for high-κ gate dielectric materials with interfacial oxide or silicate layer

✍ Scribed by V. Filip; H. Wong; B. Sen; D. Nicolaescu; C.K. Sarkar


Book ID
108207605
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
254 KB
Volume
83
Category
Article
ISSN
0167-9317

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