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[IEEE IEEE International Symposium on Power Semiconductor Devices and Integrated Circuits - Cambridge, UK (14-17 April 2003)] ISPSD '03. 2003 IEEE 15th International Symposium on Power Semiconductor Devices and ICs, 2003. Proceedings. - A high reliability and low loss 3-phase gate driver IC with a novel soft gate drive circuit for 42V motor generator system

✍ Scribed by Inaba, M.; Sakano, J.; Miyazaki, H.; Iwamura, M.; Maeda, Y.; Mashino, K.; Nagai, Y.; Mori, M.

Book ID: 111962503
Publisher: IEEE
Year: 2003
Weight: 296 KB
Edition: 2003
Volume: 0
Category: Article
ISBN-13: 9780780378766
DOI: 10.1109/ispsd.2003.1225239

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