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A new model of gate capacitance as a simple tool to extract MOS parameters

✍ Scribed by Larcher, L.; Pavan, P.; Pellizzer, F.; Ghidini, G.


Book ID
114538659
Publisher
IEEE
Year
2001
Tongue
English
Weight
270 KB
Volume
48
Category
Article
ISSN
0018-9383

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