Small-signal gate-to-drain capacitance of MOSFET as a diagnostic tool for hot-carrier induced degradation

✍ Scribed by R. Ghodsi; Y.T. Yeow

• Book ID: 108362182
• Publisher: Elsevier Science
• Year: 1997
• Tongue: English
• Weight: 535 KB
• Volume: 37
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/s0026-2714(96)00264-8