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A new method of threshold voltage extraction via MOSFET gate-to-substrate capacitance measurement

✍ Scribed by Lau, M.M.; Chiang, C.Y.T.; Yeow, Y.T.; Yao, Z.Q.


Book ID
114538787
Publisher
IEEE
Year
2001
Tongue
English
Weight
106 KB
Volume
48
Category
Article
ISSN
0018-9383

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