A new method for measuring the threshold voltage of small-geometry MOSFETs from subthreshold conduction

✍ Scribed by M.J. Deen; Z.X. Yan

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 906 KB
• Volume: 33
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(90)90234-6