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A new approach to extract the threshold voltage of MOSFETs

✍ Scribed by Ortiz-Conde, A.; Gouveia Fernandes, E.D.; Liou, J.; Rofiqul Hassan, M.; Garcia-Sanchez, F.J.; de Mercato, G.; Waisum Wong


Book ID
114536952
Publisher
IEEE
Year
1997
Tongue
English
Weight
148 KB
Volume
44
Category
Article
ISSN
0018-9383

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