New approach for defining the threshold voltage of MOSFETs

✍ Scribed by Salcedo, J.A.; Ortiz-Conde, A.; Sanchez, E.J.G.; Muci, J.; Liou, J.J.; Yue, Y.

• Book ID: 114538639
• Publisher: IEEE
• Year: 2001
• Tongue: English
• Weight: 173 KB
• Volume: 48
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.915731