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A new classification of path-delay fault testability in terms of stuck-at faults

✍ Scribed by Subhashis Majumder; Bhargab B. Bhattacharya; Vishwani D. Agrawal; Michael L. Bushnell

Book ID: 105671577
Publisher: Springer
Year: 2004
Tongue: English
Weight: 997 KB
Volume: 19
Category: Article
ISSN: 1000-9000
DOI: 10.1007/bf02973460

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