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Synthesis of asynchronous circuits for stuck-at and robust path delay fault testability

✍ Scribed by Nowick, S.M.; Jha, N.K.; Cheng, F.-C.

Book ID: 119778271
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 187 KB
Volume: 16
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.664232

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