๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

A C60 Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics

โœ Scribed by Weibel, Daniel; Wong, Steve; Lockyer, Nicholas; Blenkinsopp, Paul; Hill, Rowland; Vickerman, John C.

Book ID
111872653
Publisher
American Chemical Society
Year
2003
Tongue
English
Weight
145 KB
Volume
75
Category
Article
ISSN
0003-2700

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

A New Focused Ion Beam Optical System fo
A New Focused Ion Beam Optical System for a Time-of-flight-Secondary Ion Mass Spectrometry Instrument
โœ H. Shichi; S. Osabe; K. Kanehori ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 157 KB ๐Ÿ‘ 2 views

A new focused ion beam optical system that uses a liquid metal ion source was designed for a new secondary ion time-of-flight mass spectrometry instrument. This optical system consists mainly of two electrostatic lenses. The axial performance of the system was calculated to decide the design values

Time-of-flight-secondary ion mass spectr
Time-of-flight-secondary ion mass spectrometry of NaBF4: a comparison of atomic and polyatomic primary ions at constant impact energy
โœ M. J. Van Stipdonk; R. D. Harris; E. A. Schweikert ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 122 KB ๐Ÿ‘ 2 views

CsI) n Cs + projectiles, n = 0-3, were used to bombard a NaBF 4 (sodium tetrafluoroborate) target at the limit of single ion impacts. The relative yields of ions sputtered from the target were measured and are compared as a function of the number of atoms in the primary ion. When normalized to the m