A new focused ion beam optical system that uses a liquid metal ion source was designed for a new secondary ion time-of-flight mass spectrometry instrument. This optical system consists mainly of two electrostatic lenses. The axial performance of the system was calculated to decide the design values
Development of a highly sensitive analytical technique for surfactants by time-of-flight secondary ion mass spectrometry
β Scribed by N. Tanji; M. Okamoto
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 232 KB
- Volume
- 252
- Category
- Article
- ISSN
- 0169-4332
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