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Time-of-flight-secondary ion mass spectrometry of NaBF4: a comparison of atomic and polyatomic primary ions at constant impact energy

✍ Scribed by M. J. Van Stipdonk; R. D. Harris; E. A. Schweikert

Publisher: John Wiley and Sons
Year: 1997
Tongue: English
Weight: 122 KB
Volume: 11
Category: Article
ISSN: 0951-4198
DOI: 10.1002/(sici)1097-0231(19971030)11:16<1794::aid-rcm79>3.0.co;2-l

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✦ Synopsis

CsI) n Cs + projectiles, n = 0-3, were used to bombard a NaBF 4 (sodium tetrafluoroborate) target at the limit of single ion impacts. The relative yields of ions sputtered from the target were measured and are compared as a function of the number of atoms in the primary ion. When normalized to the mass of the primary ion, sputtered ions that do not resemble the original sample composition, (NaF) n F -, increase in yield as the primary ion complexity increases. The yields of atomic species and polyatomic ions emitted presumably as intact units decrease as the projectile complexity increases.

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