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10 nm scale electron beam lithography using a triphenylene derivative as a negative/positive tone resist

✍ Scribed by Robinson, A P G; Palmer, R E; Tada, T; Kanayama, T; Allen, M T; Preece, J A; Harris, K D M


Book ID
120346590
Publisher
Institute of Physics
Year
1999
Tongue
English
Weight
171 KB
Volume
32
Category
Article
ISSN
0022-3727

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A triphenylene derivative as a novel neg
✍ T. Tada; T. Kanayama; A.P.G. Robinson; R.E. Palmer; M.T. Allen; J.A. Preece; K.D πŸ“‚ Article πŸ“… 2000 πŸ› Elsevier Science 🌐 English βš– 601 KB

We show that a triphenylene derivative, 2,3,6,7,10,11-hexapentyl-oxytriphenylene, acts as an electron beam resist of 10-nm resolution with high dry-etch durability. The triphenylene derivative exhibited positive and negative behaviors depending on the dose and developers. When pentanol was used as a