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XPS study of arsenic doped ZnO grown by Atomic Layer Deposition

✍ Scribed by Snigurenko, D.; Jakiela, R.; Guziewicz, E.; Przezdziecka, E.; Stachowicz, M.; Kopalko, K.; Barcz, A.; Lisowski, W.; Sobczak, J.W.; Krawczyk, M.; Jablonski, A.

Book ID: 123203242
Publisher: Elsevier Science
Year: 2014
Tongue: English
Weight: 457 KB
Volume: 582
Category: Article
ISSN: 0925-8388
DOI: 10.1016/j.jallcom.2013.08.061

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