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XID: Don't care identification of test patterns for combinational circuits

✍ Scribed by Miyase, K.; Kajihara, S.

Book ID: 117907097
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 233 KB
Volume: 23
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2003.822103

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