✦ LIBER ✦

[IEEE 2007 IEEE International Symposium on Circuits and Systems - New Orleans, LA, USA (2007.05.27-2007.05.30)] 2007 IEEE International Symposium on Circuits and Systems - Low Capture Power Test Generation for Launch-off-Capture Transition Test Based on Don't-Care Filling

✍ Scribed by Wang, Sying-Jyan; Chen, Yan-Ting; Li, Katherine Shu-Min

No coin nor oath required. For personal study only.

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