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[IEEE 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - Vienna, Austria (2010.04.14-2010.04.16)] 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - Test pattern generation for the combinational representation of asynchronous circuits

✍ Scribed by Dobai, Roland; Gramatova, Elena

Book ID: 125942433
Publisher: IEEE
Year: 2010
Weight: 313 KB
Category: Article
ISBN: 1424466121
DOI: 10.1109/DDECS.2010.5491759

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