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[IEEE 2013 IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Karlovy Vary (2013.4.8-2013.4.10)] 2013 IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - A don't care identification method for test compaction

✍ Scribed by Yamazaki, H.; Wakazono, M.; Hosokawa, T.; Yoshimura, M.

Book ID: 120573531
Publisher: IEEE
Year: 2013
Weight: 280 KB
Category: Article
ISBN: 1467361348
DOI: 10.1109/DDECS.2013.6549819

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